Caesium sputter ion source compatible with commercial SIMS instruments
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چکیده
منابع مشابه
Caesium sputter ion source compatible with commercial SIMS instruments
A simple design for a caesium sputter cluster ion source compatible with commercially available secondary ion mass spectrometers is reported. This source has been tested with the Cameca IMS 4f instrument using the cluster Sin and Cun ions, and will shortly be retrofitted to the floating low energy ion gun (FLIG) of the type used on the Cameca 4500/4550 quadruple instruments. Our experiments wit...
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ژورنال
عنوان ژورنال: Applied Surface Science
سال: 2006
ISSN: 0169-4332
DOI: 10.1016/j.apsusc.2006.02.172